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PMK’s 4mm test point adapters enable direct, high-integrity connections between BumbleBee® or HORNET® high-voltage differential probes and common test points such as MMCX, SMA, BNC, and square pins — while preserving the full probe bandwidth performance..
The Test Point to 4mm Adapter Series is built to meet the demanding needs of high-voltage, high-frequency probing in power electronics applications. These adapters enable secure and low-loss connections between PMK’s high-performance differential probes (BumbleBee® or HORNET®) and test points using industry-standard connectors such as MMCX, SMA, BNC, or square pins.
Engineered to preserve the entire bandwidth performance of the probes, these adapters are optimized for accurate measurements in high-speed switching environments such as GaN/SiC device evaluation, double-pulse testing, and HV system analysis.
Note: These adapters are not intended for handheld use and should be integrated into bench-top or automated setups for safe and stable measurements.
Compatible with BumbleBee® and HORNET® series probes
Maintains full specified probe bandwidth
Supports reliable connection to:
MMCX
SMA
BNC
Square pin headers
Designed for power electronics probing tasks
Rigid, non-handheld construction for safe and accurate measurements
Compatibility: PMK BumbleBee® & HORNET® high-voltage differential probes
Adapter Types:
MMCX
SMA
BNC
Square pin headers
Bandwidth: Fully maintained as per probe’s original specification
Use Cases:
GaN/SiC power device testing
Switching power supply measurements
Double-pulse test setups
Automated or benchtop high-voltage probing
Form Factor: Non-handheld, test station compatible