The PHVX-Series probes are meticulously engineered to meet the increasing demands of power electronics design and automated testing. Whether it's low-side VDS measurements in double-pulse tests or analyzing switching transients in GaN/SiC systems, these probes deliver ultra-low capacitive loading (<3 pF) and broad bandwidth performance (>600 MHz) for unmatched signal fidelity.
Each model is built for integration—not for handheld use—into manual or fully automated test environments, with advanced safety and measurement accuracy in mind.
The universal BNC interface makes it compatible with 1 MΩ input oscilloscopes, and the innovative 360° rotatable ground ring allows direct connection to 5.08 mm pitch square pin headers with minimal parasitic influence.
The PHVX-Series comes in various configurations, including models with:
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Intelligent Read-Out (RO) for autoscaling on supported oscilloscopes
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Additional Silicone Insulation (S) for high-power testing
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Multiple cable lengths for lab or embedded system setups
A comprehensive range of accessories—such as spring tips, solder adapters, BNC adapters, and ground rings—ensures high-performance connectivity across a wide array of test points.
