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Cleverscope CS448 vs Pintek DP25: Gate Drive Measurement Comparison

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This comparison highlights the superior accuracy of the Cleverscope CS448 over the Pintek DP25 differential probe in high-speed gate drive measurements, particularly under conditions with fast common-mode voltage transitions..

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In this evaluation, a high-side gate drive with common-mode slewing of 7V to 500V in ~10 ns (~30 MHz equivalent BW) was probed using two methods:

  • Channel A (Red): Direct connect via Cleverscope CS448

  • Channel B (Blue): Pintek DP25 differential probe (CMRR > 50 dB at 1 MHz)

Key observations:

  • At 7V common-mode, the DP25 already shows visible ringing not present in CS448.

  • At 300V swing, the DP25 exhibits severe recovery artifacts and spurious ringing, misrepresenting the real gate signal.

  • At 500V common-mode, the DP25 completely distorts the waveform, showing unusable results.

  • In contrast, CS448 clearly reveals actual signal behavior including Miller plateau effects, even during rapid transitions.

Zoomed waveforms further show the DP25 unable to display meaningful data during critical switching events, while CS448 delivers high-fidelity signals unaffected by common-mode slewing.

  • CS448 accurately captures gate drive transitions under high dV/dt

  • Superior common-mode rejection at high frequencies

  • Immune to spurious ringing and recovery slews seen in traditional diff probes

  • High bandwidth response (~30 MHz) for rapid signal transitions

  • Ideal for probing high-side gate drives in half-bridge topologies

Parameter Cleverscope CS448 Pintek DP25
Input Type Direct Connect Differential Probe
Common Mode Slew Tolerance 500V in 10 ns (30 MHz) Up to 50 dB CMRR @ 1 MHz (limited)
Common Mode Rejection High (no visible ringing) Limited (significant ringing & artifacts)
Bandwidth ~30 MHz Not specified for high-speed performance
Miller Effect Visibility Clearly resolved Not detectable
Spurious Response None observed Severe above 7V swing
Application Gate drive probing, half-bridge analysis General differential measurements